The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1992
Filed:
Jan. 13, 1992
Gregory L Loumos, Ponca City, OK (US);
Shein S Wang, Ponca City, OK (US);
Thomas R Stoeckley, Ponca City, OK (US);
Conoco Inc., Ponca City, OK (US);
Abstract
A method for static correction includes a three step process which eliminates the problems of assuming hyperbolic moveout curves and forming base traces from common midpoint gathers while addressing long spatial wavelength variations. First, after calculating and applying an approximate high-frequency static correction to the individual shot and receivers (using traditional automatic methods), depth migration iterations are employed to coarsely tune the near-surface velocity layer. Second, after applying this correction, the remaining statics are incorporated into the model by tomography, which accounts for the velocity and thickness of the weathering layer and buried anomalies. Third, any residual misalignments are addressed using a multi-windowed statics adjustment within the common image point (CIP) gathers.