The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 1992

Filed:

Nov. 16, 1989
Applicant:
Inventors:

Young B No, Kyunggi-do, KR;

Dae K Kim, Kyunggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ; H04N / ;
U.S. Cl.
CPC ...
35821319 ; 35821323 ;
Abstract

A blooming measuring method for solid state image pick-up device and an apparatus thereof are disclosed, the method being constituted such that a spot beam having a certain area is irradiated to the light receiving zone of the solid state image pick-up device; the number of high level signal charges are counted from among the signal charges which are outputted from the solid state image pick-up device, and which are corresponding to one picture; and the counted value is compared with the area of the above mentioned spot beam. The apparatus of the present invention comprises: a light ray supplying means for supplying a spot beam; a driving signal generating means for driving the solid state image pick-up device; a signal detecting means for detecting only the signal charges; and a counting means for counting only the high level signals. According to the present invention, the variations of the characteristics can be excluded, and the measured results are outputted in a quantitative form, thereby making it possible to understand the characteristics exactly and precisely.


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