The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1992
Filed:
Feb. 22, 1991
Leon Kaufman, San Francisco, CA (US);
Joseph W Carlson, Kensington, CA (US);
David M Kramer, San Rafael, CA (US);
James D Hale, Berkeley, CA (US);
Kingman Yee, San Francisco, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
A measure of magnetic field inhomogeneity along a phase-encoded (e.g. y-axis) dimension is derived in k-space from previously acquired MRI phase-encoded projection data. From this, a measure of MRI data skewing caused by such inhomogeneity is obtained and used to compensate therefor. Since the MRI data is to be multi-dimensionally Fourier Transformed in most instances anyway, a transform in the relevant phase encoded dimension (e.g., y-axis) is taken followed with phase shifting each digitized data point by an amount proportional to the measured magnitude of inhomogeneity and to the datum coordinate in the read-out dimension (e.g., x-axis) and to the datum coordinate in each phase-encode dimension (e.g., y-axis) before the data is further Fourier Transformed with respect to the read-out dimension (e.g., x-axis). If two-dimensional phase encoding is employed (e.g., as in 3DFT), then a second level of similar inhomogeneity compensation can be had in the third dimension (e.g., z-axis) as well.