The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1992
Filed:
Jun. 08, 1990
Applicant:
Inventors:
Kazuhiro Komori, Kodaira, JP;
Yuji Hara, Koganei, JP;
Hideaki Takahashi, Koganei, JP;
Minoru Fukuda, Tateno, JP;
Satoshi Meguro, Hinode, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ; G11C / ; G11C / ;
U.S. Cl.
CPC ...
365182 ; 365185 ; 365201 ;
Abstract
An EPROM and a method of testing the former, in which a defective memory cell caused by defects in the insulating films between a substrate and a floating gate and between the floating gate and a control gate can be tested without writing any data in the individual memory cells by holding data lines to a low potential and word lines fed with a voltage.
Quick Actions:
Komori, Kazuhiro. (1992). Semiconductor integrated circuit device and method of testing the same (U.S. Patent No. 5155701). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5155701
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile