The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 1992

Filed:

Dec. 20, 1990
Applicant:
Inventors:

George K Schnable, Fairport, NY (US);

Steven J VanKerkhove, Rochester, NY (US);

Assignee:

General Signal Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356359 ; 356360 ;
Abstract

A catadioptric imaging system is used to form a converging test beam for measuring large aperture optical elements having convex spherical surfaces. A beamsplitter block divides a collimated beam of coherent monochromatic light from a laser source into a test beam and a reference beam. A focusing system receives the test beam and transforms the beam into a spherically diverging beam emanating from a point source. A beamsplitter plate partially reflects the diverging beam into a further diverging beam that impinges against a concave spherical mirror at a small angle from normal incidence. The mirror reflects the further diverging beam in the form of a converging beam having a numerical aperture at least nearly equal to numerical apertures of the test surfaces. The converging beam is also interrupted by the beamsplitter plate; but on this occasion, the beamsplitter plate partially transmits the converging beam toward a focal point coinciding with a center of curvature of the test surface. Rays of the converging beam that impinge at normal incidence to the test surface are retroreflected back to the point source. The returning test beam is recombined with the reference beam to form an interferogram exhibiting fringe distortions indicative of a departure of the test surface from desired sphericity.


Find Patent Forward Citations

Schnable, George. (1992). Large aperture reflective interferometer for measuring convex spherical (U.S. Patent No. 5155554). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5155554

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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