The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1992
Filed:
Oct. 25, 1990
Harbans S Dhadwal, Westbury, NY (US);
The Research of State University of New York, Albany, NY (US);
Abstract
A system for determining the physical properties of materials through the use of dynamic light scattering is disclosed. The system includes a probe, a laser source for directing a laser beam into the probe, and a photodetector for converting scattered light detected by the probe into electrical signals. The probe includes at least one optical fiber connected to the laser source and a second optical fiber connected to the photodetector. Each of the fibers may adjoin a gradient index microlens which is capable of providing a collimated laser beam into a scattering medium. The position of the second optical fiber with respect to the optical axis of the probe determines whether homodyne or self-beating detection is provided. Self-beating detection may be provided without a gradient index microlens. This allows a very small probe to be constructed which is insertable through a hypodermic needle or the like into a droplet extending from such a needle. A method of detecting scattered light through the use of a collimated, Gaussian laser beam is also provided. A method for controlling the waist and divergence of the optical field emanating from the free end of an optical fiber is also provided.