The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1992
Filed:
Dec. 17, 1990
Krupp Atlas Elektronik GmbH, Bremen, DE;
Abstract
A device for detecting deformations in the surface of a workpiece includes a light source for illuminating the surface of the workpiece; a detector situated at a fixed predetermined distance from the light source and a displacing arrangement for effecting a relative movement between the workpiece and the light source. The detector comprises a photoreceiver for receiving reflected light from the workpiece and for generating a first output signal having a frequency dependent from the deformation of the workpiece. The photoreceiver is position-sensitive perpendicularly to a direction of the relative movement. A frequency analyzer is operatively connected to the receiver for receiving the first output signal from the photoreceiver and for generating a second output signal when the frequency of the first output signal exceeds a cutoff frequency. There is further provided a deformation indicator operatively connected to the frequency analyzer for receiving the second output signal therefrom and for indicating a deformation in the surface of a workpiece when the second output signal is received.