The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1992
Filed:
Jun. 11, 1990
Masanobu Ishida, Yokohama, JP;
Yukio Yamaguchi, Kawasaki, JP;
Fumio Orito, Abiko, JP;
Kizuku Katano, Tsukuba, JP;
Hideo Okada, Chikushino, JP;
Fumikazu Yajima, Inashiki, JP;
Mitsubishi Kasei Polytec Company, both of, JP;
Mitsubishi Kasai Corporation, both of, JP;
Abstract
A system for setting an analysis condition for a thermal analysis of a fluid inside an apparatus, wherein a gas flow-in temperature in the apparatus, a gas flow-in rate, and an apparatus outer wall temperature are set as critical conditions, the interior of the apparatus being under a high pressure atmosphere and heated by a heater, an analysis mesh shape, a pressure inside the apparatus and other values, and a heater power, are set as initial values, and a simulation is carried out so that an optimum operating condition is obtained, wherein the relationship between heater power by which a heater monitoring temperature is maintained at a constant value and a gas flow rate at the entrance while changing the apparatus internal pressure is obtained by a trial experiment, and the simulation is carried out by changing the gas flow rate at the entrance in accordance with the heater power and the gas flow rate at the entrance set as the initial value.