The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1992
Filed:
Aug. 23, 1991
Haruo Takeda, Tokyo, JP;
Seiko Instruments, Inc., Tokyo, JP;
Abstract
A tension type dynamic viscoelasticity measuring apparatus composed of a strain detector for detecting changes in length of a specimen, an electromagnetic force generator for applying a force to the specimen, a moving mechanism for moving the electromagnetic force generator, a movement control unit for controlling the amount of movement of the moving mechanism, and a monotone function calculation unit for outputting a movement control timing to the movement control unit. The monotone function calculation unit performs a monotone function operation on the data of distance by which the moving mechanism has been moved and uses the calculation result as a movement control timing for the next movement control of the moving mechanism. As a result, this viscoelasticity measuring apparatus has a movement control loop that considers relaxation phenomena in connection with a change in length of the specimen due to stress relaxation and creep that occur in the specimen while driving the moving mechanism.