The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 1992

Filed:

Feb. 22, 1990
Applicant:
Inventor:

Kenn A Beauchaine, Madison, WI (US);

Assignee:

Nicolet Instrument Corporation, Madison, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01N / ;
U.S. Cl.
CPC ...
356346 ; 356244 ; 250339 ;
Abstract

A modular optical system for a Fourier transform infrared spectrometer which has a baseplate assembly with a baseplate having a top surface and two mirrors mounted to focus at a point above the baseplate. At least two pins extend upwardly from the baseplate top surface and are fixed with respect to the foci of the mirrors. An accessory module has a flat bottomed positioning plate with portions defining pin holes to coincide with the pins of the face plate. A sample holding accessory platform extends from the positioning plate and is fixed with respect to the pin holes so that when the pin holes of the positioning plate are positioned over the pins of the baseplate and the positioning plate bottom surface is engaged with the locator pads on the baseplate, the sample is located at the foci of the mirrors. Three accessory module guides are located on the baseplate having spring-mounted retainer balls accurately spaced a common distance from the surface of the baseplate which engage beveled chamfers in the sides of the positioning plate and hold the accessory module in place. A sample to be analyzed may be placed in the accessory module and positioned in the FTIR spectrometer by hand, requiring no tools to accurately position the sample.


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