The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 1992

Filed:

Jul. 11, 1990
Applicant:
Inventors:

Kouji Kobayashi, Hino, JP;

Itaru Yoshizawa, Hino, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128665 ; 351206 ; 351221 ;
Abstract

A fundus examining device is provided in which laser light from a laser light source is deflected for scanning in two dimensions over an eye fundus of an eye being examined and light reflected from the eye fundus is photoelectrically detected with a photodetector to obtain fundus information. The fundus examining device includes an optical system for observing an anterior portion of the eye which is illuminated by illuminating light to determine how the pupil of the eye is dilated. To this end, an objective mirror is provided which reflects light of the wavelength of the laser beam but is transparent to the illuminating light. The objective mirror reflects the deflected laser beam to illuminate the fundus of the eye, while guiding light from the illuminated anterior portion of the eye to the observing optical system.


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