The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 1992
Filed:
Nov. 17, 1989
James C Beebe, Kent, OH (US);
Barry D Cargould, Hudson, OH (US);
David W Lees, Sr, North Canton, OH (US);
Illinois Tool Works Inc., Chicago, IL (US);
Abstract
An object is positioned in fixed relation to a measuring axis without regard to centering the object on the axis and at least one series of data samples correlated to the distance between the measuring axis and a series of points located at angularly spaced intervals on at least one surface feature of the object are generated and stored. To determine the center of a first surface feature, the corresponding series of samples is analyzed to identify samples therein corresponding to points lying on a maximum inscribed circle whose center corresponds to that of the surface feature. To measure a second surface feature of an object with reference to the center of a first surface feature thereof, a first signal and a second signal correlated to the distance between the measuring axis and points on the first surface feature and second surface feature, respectively are generated. The center of the first surface feature is then determined to define a vector indicating the positional offset between the measuring axis and that center. The second signal is then adjusted in accordance with that vector to provide a coordinate-corrected signal to be used as a basis for a centered measurement.