The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 1992
Filed:
Aug. 16, 1990
Shunichi Seto, Kanagawa, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
Defects in a measurement device are detected in a biochemical analysis apparatus wherein a droplet of liquid sample is applied to an analysis medium containing a reagent, which chemically reacts with a specific constituent in the liquid sample, the analysis medium is then incubated, the optical densities of the analysis medium are determined, and concentration of the specific constituent in the liquid sample is determined from the optical densities of the analysis media thus determined. The method for detecting defects comprises the steps of irradiating light, which has passed through a plurality of interference filters by turns, to a reference density plate, and measuring the amount of light reflected by the reference density plate. Measured values representing the amounts of reflected light, which have thus been measured for the interference filters, are compared with one another. Defects in the measurement device are detected from the results of the comparison.