The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 1992

Filed:

Aug. 07, 1990
Applicant:
Inventors:

Anthony J Bur, Rockville, MD (US);

Robert E Lowry, Falls Church, VA (US);

Steven C Roth, Frederick, MD (US);

Charles L Thomas, Philadelphia, PA (US);

Francis W Wang, Gaithersburg, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 32 ; 73 5401 ; 73 5301 ; 356364 ;
Abstract

A method of measuring fluid properties of a polymer melt, undergoing shear and/or extensional flow which utilizes fluorescent anisotropy. The method utilizes a polymeric chromophore which includes a bifunctional anthracene that is covalently bonded to polybutadiene. The invention also involves an optical probe which is designed to be inserted into existing temperature and/or pressure probe ports in processing equipment. The probe includes a rotatable polarizer and emission collection fibers.


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