The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 1992
Filed:
Mar. 08, 1991
Applicant:
Inventors:
Toshiaki Yutori, Takasago, JP;
Yutaka Kanetsuki, Akashi, JP;
Assignee:
Kabushiki Kaisha Kobe Seiko Sho, Kobe, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 725 ; 3241 / ;
Abstract
An inspection probe which allows a plurality of such inspection probes to be arranged at a remarkably reduced pitch. The inspection probe comprises a very thin metal wire having a diameter of 120 .mu.m or less and so shaped as to have self resiliency, and a plated noble metal layer formed on a surface of the very thin wire. A probe pin head for the inspection of an electronic circuit board is constructed employing a plurality of such inspection probes. The inspection probes are secured to or embedded in a base made of a resin material. A process of producing the probe pin head is also disclosed.