The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 1992
Filed:
Jul. 10, 1991
Jack Goldberg, San Diego, CA (US);
Robert J Rosati, Carlsbad, CA (US);
IVAC Corporation, San Diego, CA (US);
Abstract
An infrared detector receives infrared energy from the target and provides a detector signal based primarily on the difference between the infrared detector temperature and the temperature of the reference temperature area of the detector. A contact temperature measurement device provides a reference signal which is a function of the temperature of the reference temperature area of the detector. A processor receives the detector and reference signals and combines the two signals in a non-linear manner to result in a signal which is representative of the temperature of the target. The method of non-linearly combining includes the use of gain and offset terms which may be altered to a limited extent by a technician in the field with a blackbody calibration source. As a result of the recalibration, accurate target temperature measurements are continually provided. Additionally, the method of non-linearly combining includes the use of additional gain and offset terms which are adjusted to account for the infrared radiation characteristics of an anatomical target as compared to blackbody calibration source targets. Temperature is determined by combining a polynomial function of the detector with a polynomial function of the reference signal.