The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 1992
Filed:
Jan. 04, 1991
Josef Kosanetzky, Norderstedt, DE;
Karl H Fischer, Hamburg, DE;
U.S. Philips Corporation, New York, NY (US);
Abstract
A device for examining a test object (4) by means of gamma or X-rays, comprising a primary X-ray source for generating at least one primary X-ray pencil beam (3) which is directed onto the test object (4), and at least one slit diaphragm (8, 9) which is arranged between the test object (4) and a detector (6, 7) and which directs scattered X-rays (26, 27, 28, 29) produced by the primary X-ray beam (3) in the test object (4) onto at least one detector (6, 7). The depth range of the test object that can be covered by the detectors can be changed without changing the position of the test object or the examination device, in that the position of the slit diaphragm (8, 9) relative to the detector (6, 7) can be changed by means of an adjusting device (18, 19).