The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 1992

Filed:

Jul. 19, 1991
Applicant:
Inventors:

Hirokazu Tanaka, Tokyo, JP;

Kiyomitsu Ishikawa, Tokyo, JP;

Tomohiro Yamaguchi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250561 ; 356-4 ;
Abstract

Here is disclosed an optical gauging apparatus utilizing light reflected on an object to be gauged and being useful for gauging of, for example, car level, spring deflection and photographic distance. Light emitted from a single light source is split into a pair of light components propagated along a pair of optical paths, respectively, the light components thus split are projected along different optical path lengths onto the object, at least one of the light components is intermittently shielded and the light components reflected on the object are photoelectrically converted to the corresponding photoelectric conversion signals which are then time-division processed so as to provide a desired gauging information.


Find Patent Forward Citations

Tanaka, Hirokazu. (1992). Optical gauging apparatus using dual beams and intermittent interruption (U.S. Patent No. 5149952). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5149952

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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