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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 5149675 B1

PDFFull Text
Date of Patent:
Sep. 22, 1992

Filed:

Dec. 31, 1990

Ring crystallization of wafers to prevent thermal shock

Applicant:
Inventors:

Kendall S Wills, Houston, TX (US);

Paul A Rodriguez, Lewisville, TX (US);

Melvin L Brewer, Plano, TX (US);

Assignee:

Texas Instruments Incorporated, Dallas, TX (US);

Attorneys:

Neerings; Ronald O.

Bassuk; Lawrence J.

Donaldson; Richard L.

Primary Examiner:

Olik Chaudhuri

Assistant Examiner:

Ken Horton

Int. Cl.
CPC ...
C30B / ;
U.S. Cl.
CPC ...
437248 ; 437174 ; 437939 ;
Abstract

A ring of polycrystalline material is developed around the edge of a wafer by general heating of the wafer and localized heating with a laser beam followed by rapid cooling. The ring of polycrystalline material helps prevent wafer breakage due to thermal shock. One or more additonal ring, loop or closed figures of polycrystalline material can be formed inside of said ring of polycrystalline material developed around the edge of the wafer to further reinforce the wafer.

Find Patent Forward Citations

Wills, Kendall. (1992). Ring crystallization of wafers to prevent thermal shock (U.S. Patent No. 5149675). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5149675

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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