The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 1992
Filed:
Nov. 28, 1990
Javad Haj-Ali-Ahmadi, Austin, TX (US);
Jerome A Frankeny, Taylor, TX (US);
Richard F Frankeny, Austin, TX (US);
Adolph B Habich, Georgetown, TX (US);
Karl Hermann, Austin, TX (US);
Ronald E Hunt, Georgetown, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus is provided for testing integrated circuits and permanently affixing the ICs which are successfully tested to a product level carrier substrate. A modular test oven is used which allows the chips to be electrically and thermally tested with the chips non-permanently affixed to a carrier substrate. If all of the chips on the carrier substrate test good, then the temperature within the oven is elevated, thereby reflowing the solder balls and permanently affixing the chips to the carrier substrate. This card can then be used in the manufacture of an electronic device without the necessity of reworking the burned-in ICs. Further, if any of the chips fail the burn-in testing, the time and overhead required for reworking is minimized since the chips are not permanently attached.