The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 1992

Filed:

Nov. 27, 1991
Applicant:
Inventors:

Richard W Midland, Inverness, IL (US);

Boris Rozansky, Buffalo Grove, IL (US);

Thomas W Tepe, Oak Park, IL (US);

Assignee:

Zenith Electronics Corporation, Glenview, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ; H01J / ;
U.S. Cl.
CPC ...
445-3 ; 445 30 ; 445 64 ; 445 68 ; 358107 ;
Abstract

An optical interrogation system has camera arrays useful for determining the locations of a plurality of apertures on a flat tension shadow mask and fiducial marks on a screened front panel of a CRT. The system determines the actual location of apertures or fiducial marks with respect to the cameras' field of view. By eliminating gray scaling, the processing only for light/dark transitions in single-bit binary valued pixels from each of the cameras in parallel, i.e., simultaneously, remarkable rapidity is obtained in the interrogation of widely spaced fields with minimal hardware. The system may also be used to interrogate mask support surfaces on the front panel prior to welding the mask thereto.


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