The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 1992

Filed:

Jun. 18, 1991
Applicant:
Inventor:

Hajime Suhara, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S / ;
U.S. Cl.
CPC ...
372 49 ;
Abstract

A reflectance control film is formed on the end facet of an oscillator in a semiconductor laser device. The reflectance control film has a laminated structure of a first thin film formed on the end facet of the oscillator and a second thin film formed on the first thin film. The film thickness of the first thin film is set to be '.lambda./4n.sub.1 ' and n.sub.1 .ltoreq.1.8 where the peak wavelength of the oscillator is .lambda. and the refractive index of the first thin film is n.sub.1. The film thickness of the second thin film is set to be '.lambda./4n.sub.2 ' and 1.9.ltoreq.n.sub.2 .ltoreq.2.6 where the peak wavelength of the oscillator is .lambda. and the refractive index of the second thin film is n.sub.2.


Find Patent Forward Citations

Suhara, Hajime. (1992). Semiconductor laser device having reflectance control film formed on end (U.S. Patent No. 5144635). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5144635

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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