The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1992
Filed:
Jan. 03, 1990
Applicant:
Inventors:
Nobuyuki Horie, Tenri, JP;
Toshihiro Yamanaka, Ikoma, JP;
Daiji Yamane, Tenri, JP;
Noriaki Sakamoto, Souraku, JP;
Assignee:
Sharp Kabushiki Kaisha, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06R / ;
U.S. Cl.
CPC ...
371 221 ; 371 151 ;
Abstract
A test mode switching system includes a register for storing test signal data and for outputting the test signal data to a self testing circuit for checking whether or not the LSI operates correctly. A memory stores a test inhibiting signal and a test allowing signal received from a CPU through the control signal terminal of the LSI. The register is enabled to output test signals depending on the condition of the output of the memory whereby the LSI can operate either under a normal operation mode or under a test mode.