The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1992
Filed:
Apr. 23, 1991
Applicant:
Inventors:
Jeffrey Tenenbaum, Southfield, MI (US);
Peter A Hochstein, Troy, MI (US);
Teiji Okuyama, Birmingham, MI (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P / ; G01P / ; H03D / ; H03H / ;
U.S. Cl.
CPC ...
324164 ; 324166 ; 32420712 ; 32420725 ; 324225 ; 328-5 ; 328167 ; 329349 ; 364565 ; 36457101 ; 364572 ;
Abstract
An RF oscillator induces eddy currents to be measured in an object. An eddy current probe senses alterations, such as teeth on a disc, for example, in the object which are represented as eddy current signals sensed by an eddy current probe. The present invention separates alteration current signals from offset currents in the eddy current signal to aid in discriminating levels in the alteration current signals. The alteration currents are separated from the offset currents by AC coupling with a high pass filter or separated by a microprocessor as part of a data processing detection routine.