The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1992
Filed:
Dec. 04, 1990
Dieter Schafer, Schriesheim, DE;
Stephan Sattler, Peissenberg, DE;
Peter Scheunert, Mannheim, DE;
Franz Laufenberg, Grunstadt, DE;
Hans List, Lampenhain, DE;
Klaus Steeg, Kronau, DE;
Eugen Serrallach, Edingen, DE;
Boehringer Mannheim GmbH, Mannheim, DE;
Abstract
A test strip evaluating instrument is used for testing of multiple test strips, and has a transport and positioning device which transports the test strips at right angles to their longitudinal direction from a test strip feed area along a transport path to a disposal area. At least one measuring station with an optical measuring unit is arranged on the transport path. Rails, on which the test strips slide, run along the transport path. The test strips are transported in a step-wise manner by at least two rows of cam elements following one another in the transport direction, and these two rows of cam elements move synchronously with one another in a periodically recurring movement path. The handling of the test strips is facilitated without impairment of the measuring accuracy by the fact that the rails are longitudinally aligned as thin ribs in a disposable transport insert made of a thin plastic material, in which the cam elements engage from above between adjacent pairs of the rails of the transport insert, and in which a bearing element is provided for the tranport insert which supports the transport insert with a support surface in a central area lying between the test strip feed area and the disposal area. A rigid contact-pressure element is also provided, against which the test strip is pressed elastically from below during the measurement, and this contact-pressure element is disposed at the measuring station at a predetermined distance from the optical measuring unit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile