The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 1992

Filed:

Jul. 27, 1990
Applicant:
Inventors:

Wise Young, New York, NY (US);

Kaoru Sakatani, New York, NY (US);

Assignee:

New York University, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128741 ; 128745 ; 128746 ; 73579 ;
Abstract

The behavioral tendencies of a system in which responses evoked by stimuli are measurable are determined by means of a method and apparatus for applying a train of paired stimuli to the system and measuring and analyzing the response. The first of each pair of stimuli (conditioning stimulus) is applied at randomly varying intensities and at a constant interval. The second of each pair of stimuli (test stimulus) is applied at a constant intensity and a randomly varying interval from its associated test stimulus. By appropriate analysis of the amplitude and latency of the evoked responses, important information about fatigue, refractory period, supernormal period, threshold and dynamical fluctuation can be determined.


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