The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 1992
Filed:
Nov. 03, 1989
Applicant:
Inventor:
Wallace B Harwood, III, Austin, TX (US);
Assignee:
Motorola, Inc., Schaumburg, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395800 ; 3642596 ; 3642608 ; 3642633 ; 3642645 ; 364D / ; 371 151 ; 395575 ;
Abstract
A data processor has a test mode which may be selectively accessed for either production testing of the processor or user testing from an external control signal. To enter the test mode, both an external signal applied to an integrated circuit package pin of the data processor and a register bit must be asserted. If only the register bit is asserted, the special mode cannot be entered until the data processor has been reset again.
Harwood, III, Wallace. (1992). Data processor test mode access method (U.S. Patent No. 5142688). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5142688
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile