The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 1992
Filed:
Oct. 25, 1990
Isao Yamazaki, Niihari, JP;
Hiroshi Ohki, Tsuchiura, JP;
Toshio Kaneko, Katsuta, JP;
Keiji Kataoka, Katsuta, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An apparatus for counting and analyzing sample particles such as cells suspended in a fluid by applying an irradiation beam such as a laser beam to the sample particles in a flow cell. The apparatus includes a device for supplying a flow cell with suspension of sample particles, an optical system for applying a laser beam to the sample particles in the above-mentioned suspension, a light gathering device for forming image of the above-mentioned sample particles, a light sensing device for sensing light from the above-mentioned formed image of the sample particles, and an analysis for analyzing the above-metnioned sample particles on the basis of the above-mentioned sensed light. The optical system may include a polarizing beam splitter and such convergent lenses having mutually different magnifications relative to two directions perpendicular to the optical axis of the laser beam.