The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 1992

Filed:

Apr. 22, 1991
Applicant:
Inventors:

Suk K Min, Seoul, KR;

Yong J Park, Seoul, KR;

Seung C Park, Seoul, KR;

Chul W Han, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D / ;
U.S. Cl.
CPC ...
422250 ; 156601 ; 1566207 ; 15662072 ; 15662076 ; 422248 ;
Abstract

An apparatus for growing a single crystal of a semiconductor compound of Group III-V or Group II-VI such as GaAs, InP, or CdTe by using a horizontal zone melt technique. A direct monitoring furnace comprising a double quartz tube made of a transparent material is disposed in the high temperature section of the grower, thereby enabling the observation of the entire crystal growth procedure with the naked eye or with a CCD (charge coupled device) camera tube, enabling high-speed variation of temperature gradient as well as high-speed heating, and thus enabling the single crystal growth of GaAs with low defects and high uniformity, and thus enabling the single crystal growth of GaAs with low defects and high uniformity in the axial direction of growth. The direct monitoring furnace includes a sub-heater as well as a main heating wire, so that a spike zone can be formed, thereby enabling the manufacture of GaAs wafers with low defects and high uniformity.


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