The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 1992

Filed:

Jul. 16, 1991
Applicant:
Inventor:

Tadashi Ichihashi, Hachioji, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351221 ; 351205 ; 128745 ;
Abstract

An ophthalmological measurement apparatus which projects a laser beam into a subject's eye and conducts a prescribed ophthalmological measurement based on the state of laser light scattering in the eye comprises a laser beam projection system for converging a laser beam from a laser source at a measurement point in the eye, a light receiving system for receiving scattered laser light from the interior of the eye by a photosensor means thereof and detecting the light scattering state inside the eye from the measured number of pulses output by the photosensor means. In this arrangement, the sensitivity of the photosensor means is measured, and the result of the light scattering state detection is automatically corrected according to the measured sensitivity of the photosensor means so that accurate ophthalmological measurement results can be obtained notwithstanding aging of the photosensor means or changes in its environmental conditions.


Find Patent Forward Citations

Ichihashi, Tadashi. (1992). Ophthalmological measurement apparatus having sensitivity error (U.S. Patent No. 5141304). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5141304

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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