The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 1992

Filed:

Mar. 02, 1990
Applicant:
Inventors:

Steven W Cox, Chesnee, SC (US);

Harold L Johnson, Jr, Pauline, SC (US);

Assignee:

Milliken Research Corporation, Spartanburg, SC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364470 ; 371 151 ;
Abstract

A diagnostic system checks the major hardware components in a pattern control system used in a textile dyeing apparatus. The system includes bypass logic circuitry which permits selective bypassing of either the look-up tables, stagger memories, or both the look-up tables and the stagger memories in the pattern control system. The diagnostic system checks the look-up tables in the pattern control system to assure that the address lines for the look-up tables operate properly. A prime number pattern is loaded into the look-up tables such that each address location for each look-up table will have a different piece of data. The look-up tables are then read in address sequence and the output thereof compared with a previously stored prime number pattern to determine whether any errors arose. The system further checks the firing times produced by the gatling memory section of the pattern control system by simulating a machine speedup and checking for the onset of machine optimum speed and machine overspeed.


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