The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1992
Filed:
Nov. 13, 1989
Applicant:
Inventor:
Takao Hayashi, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371-91 ; 395575 ; 364D / ; 3642681 ; 3642689 ;
Abstract
Disclosed is a method of checking a test program in a duplex processing apparatus including two processors connected to each other through a failure acknowledge line and an interprocessor communication line and constituting an active system and a standby system, main memories connected to the two processors through buses, respectively, a queue connected to the buses which connect the processors to the main memories, and bus arbitors for controlling contention of a bus occupy right on the buses. In this method, normality of the test program is checked from an execution address of the test program executed by the standby processor under the control of the active processor.