The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1992
Filed:
Feb. 25, 1991
Hidetaka Shintaku, Nara, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
A magnetic field distribution measuring apparatus for measuring an external magnetic field distribution includes a substrate made of a nonmagnetic material and having opposite surfaces, a plurality of magnetoresistive elements deposited on one surface of the substrate and each made of a superconductive material having a weak coupling at the grain boundaries. Coils are provided on the other surface of the substrate at positions corresponding to the magnetoresistive elements. The coils are sequentially applied with AC current to produce AC magnetic field having a peak value greater than a magnetic field threshold level at which the magnetoresistive element changes the state from a superconductive state to a magnetoresistive state. Detecting the degree of magnetoresistive from each magnetoresistive element, the magnetic field distribution can be detected.