The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1992
Filed:
Jul. 27, 1990
Katsunori Sakiyama, Hachioji, JP;
Yoshikazu Tojo, Fussa, JP;
Yasundo Tanaka, Urawa, JP;
Morihide Mizumoto, Hachioji, JP;
Minoru Okada, Sagamihara, JP;
Masanao Murata, Tokorozawa, JP;
Atsushi Miyazaki, Hachioji, JP;
Takeaki Nakamura, Hino, JP;
Hiromasa Suzuki, Akishima, JP;
Olympus Optical Co., Ltd, Tokyo, JP;
Abstract
An eddy current flaw detecting endoscope apparatus has an endoscope having an elongate insertable part and an objective optical system provided on the tip side of the insertable part. A flaw detecting device is provided on the tip side of the endoscope. A signal processing device processes a signal for the flaw detecting device. An eddy current flaw detecting apparatus detects a flaw in an object to be inspected and generates a flaw detecting signal. A controlling device generates a control signal controlling a controlled device with a flaw detecting signal of the eddy current flaw detecting apparatus.