The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1992
Filed:
Jul. 13, 1990
Applicant:
Inventors:
Yonn K Simpson, Fairport, NY (US);
Edward F Grabowski, Webster, NY (US);
Donald J Teney, Rochester, NY (US);
Satish R Parikh, Rochester, NY (US);
Neil S Patterson, Pittsford, NY (US);
Assignee:
Xerox Corporation, Stamford, CT (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
430 58 ; 430 59 ; 430 60 ; 430 63 ;
Abstract
A layered photosensitive imaging member is modified by forming a low-reflection layer on the ground plane. The low-reflection layer serves to reduce an interference fringe contrast and according to a second aspect of the invention, layer adhesion is greatly improved when selecting TiO.sub.2 as the low-reflection material. In a preferred embodiment, low-reflection materials having index of refraction greater than 2.05 were found to be most effective in suppressing the interference fringe contrast.