The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1992
Filed:
Oct. 02, 1990
Applicant:
Inventors:
Sanji Kitaoka, Kanbara, JP;
Susumu Nawata, Kanbara, JP;
Hisashi Hori, Kanbara, JP;
Katsumi Takahashi, Kanbara, JP;
Assignee:
Nikkei Techno-Research Co. Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356243 ; 356313 ;
Abstract
A standard test specimen for optical emission spectrochemical analysis is prepared by molding into the specimen body finely divided particles consisting essentially of the metal or metal alloy to be analyzed without melting the same and preferably by plastic deformation of such particles. The resultant specimen is homogeneous throughout and stable in quality so that accurate analysis of any of its elements is possible and the suitability of the test material for a given product can be accurately predicted.