The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 1992

Filed:

Jun. 20, 1990
Applicant:
Inventors:

Georges Thiebaut, Perros Guirec, FR;

Denis Le Bihan, Lanmerin, FR;

Assignee:

Alcatel Cit, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J / ; H04J / ; H04J / ;
U.S. Cl.
CPC ...
370 13 ; 370 941 ;
Abstract

A memory location is assigned to each virtual circuit, this location containing a context (CT) that defines the evaluation conditions for measuring the throughput of the virtual circuit and then, upon reception of each cell, providing for the context relating to the virtual circuit to which the cell belongs to be read. A clock signal is adapted to supply a current time associated with this virtual circuit. An indication of the measuring interval start time is written into the context (CT) for a virtual circuit upon arrival of a first cell for this virtual circuit. Upon the arrival of a subsequent cell for this virtual circuit, the context is read and from the current time (hc) the time interval start time is subtracted. The time difference is compared to a specified measurement interval duration and the number of cells already received is incremented. This number of cells already received is used as a measurement of the mean throughput of the virtual circuit when the time difference is equal to or greater than the duration of the measurement interval. The context is then re-initialized.


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