The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 1992

Filed:

Jan. 16, 1991
Applicant:
Inventors:

Rasmus Debitsch, Oberkochen, DE;

Eckhard Enderle, Aalen-Dewangen, DE;

Helmut Muller, Schwabisch Gm/und Grossdeinbach, DE;

Assignee:

Carl-Zeiss-Stiftung, Heidenheim/Brenz, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
364560 ; 36457104 ;
Abstract

The invention contemplates a technique to correct for measurement error which is attributable to gravitational sag of a probe head (6) mounted to a multiple-axis articulating head (2). To this end, a variable (b) is determined which describes the stiffness of the articulating head (2) and/or of a probe extension (5) mounted thereto, said variable being characteristic for the probe configuration in question and being entered into the memory of the computer of the coordinate-measuring machine. The sag B (.alpha., .beta.) which has differing values that depend on actual angular positions (.alpha., .beta.) is then calculated from these angular positions for each of the angular positions, and the calculated sag value is appropriately taken into account in computer-reporting of coordinate-measurement values made by the machine. Calibration of the articulating head in each of the various different angular positions is therefore unnecessary.


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