The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 1992

Filed:

Aug. 16, 1990
Applicant:
Inventor:

James M Kendall, Jr, Pasadena, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73147 ; 7317 / ; 73180 ;
Abstract

A method and apparatus for sensing wave flow across a surface wherein at least two pressure levels are sensed and combined to provide a representation of waves within the flow. In the preferred embodiment holes bored through the aircraft surface at an interval of one-half the wavelength of the flow being measured introduce pressure perturbations into a cavity so they may acoustically interfere. The interfering waveform is sensed by at least one microphone disposed in the cavity.


Find Patent Forward Citations

Kendall, Jr, James. (1992). Measurement of waves in flows across a surface (U.S. Patent No. 5136881). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5136881

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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