The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1992
Filed:
Sep. 27, 1989
Makoto Kanebako, Tsukuba, JP;
Muneharu Ishikawa, Ryuugasaki, JP;
Kowa Company Ltd., , JP;
Abstract
Disclosed is a particle measurement method and apparatus for measuring particle properties in which a laser beam is projected into a detection region in a medium containing particles to be measured, and a photoelectric detector having a predetermined dynamic range is used to detect the laser light scattered by the particles in the medium to produce signals which are evaluated to measure the particle properties. The polarization of the laser beam and the intensity of the scattered light are regulated in accordance with the range of particle sizes measured so that the intensity of the scattered light is within the dynamic range of the photoelectric detector. This arrangement makes it possible to expand the range of particle sizes with an improved resolving power in particle measurement without multi-valued ranges.