The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1992
Filed:
Aug. 10, 1989
Toshihiko Satake, Higashihiroshima, JP;
Satoru Satake, Oota, JP;
Yasuharu Mitoma, Higashihiroshima, JP;
Satake Engineering Co., Ltd., Tokyo, JP;
Abstract
An apparatus for evaluating the grade of rice grains includes a grain supply unit, vibrating troughs on which the rice grains run in their longitudinal posture, flow-down troughs having slits each opening to each of the flow-down troughs, a reflected light measuring unit having its light sources and its detecting element for detecting the amount of the light reflected from the rice grains, a transmitted light measuring unit having its light sources and its detecting element for detecting the amount of the light transmitted through the rice grains at the positions of the slits, and a calculation control unit for digitally calculating the values measured at the reflected light measuring unit and the transmitted light measuring unit for evaluating the rice grains into a plurality of grades. The light sources for reflection may be of visible light and the light source for transmission may be of infrared light. Also, it is possible to use a single unit, namely, a reflected and transmitted light measuring unit, having a reflected light detecting element and a transmitted light detecting element for measuring both the reflected light amount and the transmitted light amount from the rice grains at the same positions of the slits.