Apparatus and method for critical current measurements

Abstract

An apparatus for the measurement of the critical current of a superconductive sample, e.g., a clad superconductive sample, the apparatus including a conductive coil, a means for maintaining the coil in proximity to a superconductive sample, an electrical connection means for passing a low amplitude alternating current through the coil, a cooling means for maintaining the superconductive sample at a preselected temperature, a means for passing a current through the superconductive sample, and, a means for monitoring reactance of the coil, is disclosed, together with a process of measuring the critical current of a superconductive material, e.g., a clad superconductive material, by placing a superconductive material into the vicinity of the conductive coil of such an apparatus, cooling the superconductive material to a preselected temperature, passing a low amplitude alternating current through the coil, the alternating current capable of generating a magnetic field sufficient to penetrate, e.g., any cladding, and to induce eddy currents in the superconductive material, passing a steadily increasing current through the superconductive material, the current characterized as having a different frequency than the alternating current, and, monitoring the reactance of the coil with a phase sensitive detector as the current passed through the superconductive material is steadily increased whereby critical current of the superconductive material can be observed as the point whereat a component of impedance deviates.