The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 1992
Filed:
Sep. 25, 1990
Ronald D Wertz, Boulder, CO (US);
H Kent Minet, Littleton, CO (US);
Daniel J Messerschmidt, Broomfield, CO (US);
Carey Brown, Denver, CO (US);
Ball Corporation, Muncie, IN (US);
Abstract
An optical inspection system inspects individual sheets having scrolled and unscrolled edges for defects in a production line with high transfer velocities. Each of the individual sheets are delivered in a production line with some spacing between them and potentially with some degree of skewness and offset from the production center line. The inspection system of the present invention utilizes a formed viewing window over which individual sheets from the production line are delivered. As each sheet is delivered over the formed viewing window, the undersurface of each individual sheet is uniformly and continuously illuminated along the length of the formed viewing window with high intensity diffused light. The reflected light from the surface of each moving individual sheet is captured by at least one video camera. As the sheet moves across the formed viewing window, a line-by-line video image is captured and stored according to a rectangularization technique which eliminates the need for customized masks. An analyzer receives the stored information and analyzes the stored information for the presence of defects.