The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 1992
Filed:
Nov. 20, 1989
Applicant:
Inventors:
Masanobu Kawakami, Tokyo, JP;
Akio Kokubu, Tokyo, JP;
Assignee:
Eddio Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324240 ; 324238 ;
Abstract
An AC magnetic flux leakage type flaw detecting apparatus for use in flat surface flaw detecting comprises AC exciting means having a pair of magnetic poles for exciting a steel material to be flaw detected, a leakage magnetic flux detecting element, and rotatably scanning means for rotatably scanning the magnetic flux leakage detecting element in a surface substantially parallel to the flat surface oppositely to the flat surface to be flaw detected of the steel material in a plane of an exciting magnetic field between the pair of magnetic poles.