The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 1992

Filed:

Jun. 15, 1990
Applicant:
Inventors:

Kazunori Higuchi, Aichi, JP;

Osamu Ozeki, Aichi, JP;

Shin Yamamoto, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382-8 ; 382 67 ; 358107 ;
Abstract

A system for measuring three-dimensional shapes and dimensions includes: an imaging unit which faces an object with shape changes on the surface and images by means of a TV camera the slit line formed on the object surface by projecting slit light from a slit light source at a fixed angle; and a surface feature extraction member for extracting features representing the shape changes of the object surface, based on the changes of the XYZ coordinate values of the object surface detected by triangulation based on the centroid position of the intensity distribution of the slit line image corresponding to the scanning lines from the TV camera. Based on features thus extracted, the surface shape of the object can be measured rapidly with high precision.


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