The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1992
Filed:
Jan. 25, 1991
Nathan A Yates, Alachua County, FL (US);
Stephen C Bradshaw, Monterey County, CA (US);
Richard A Yost, Alachua County, FL (US);
David B Tucker, Santa Clara County, CA (US);
Finnigan Corporation, San Jose, CA (US);
Abstract
This invention relates generally to a method of operating an ion trap mass spectrometer to determine the resonant excitation frequencies of trapped ions. This can be achieved by: (1) introducing sample ions into the ion trap volume: (2) adjusting the trapping fields so that parent ions having a mass-to-charge ratio of interest which are to undergo collision induced dissociation (CID) are trapped; (3) applying an excitation voltage of predetermined frequency and amplitude across the end caps of the ion trap; (4) scanning the frequency of the excitation voltage in a first direction and monitoring for ejection of the parent ions; (5) repeating steps (1) through (3) and scanning the frequency of the excitation voltage in an opposite direction and monitoring for ejection of the parent ions; (6) averaging the frequencies at which the ions are ejected; and (7) applying that frequency in a subsequent MS/MS scan to promote CID of the parent ions to form daughter ions.