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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 5127063 B1

PDFFull Text
Date of Patent:
Jun. 30, 1992

Filed:

Sep. 20, 1989

Processor for pattern data, measured process information, and image

Applicant:
Inventors:

Takushi Nishiya, Machida, JP;

Motohisa Funabashi, Sagamihara, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:

Antonelli, Terry, Stout & Kraus

Primary Examiner:

Michael Razavi

Assistant Examiner:

Michael R Cammarata

Int. Cl.
CPC ...
G06K / ; G06K / ; G06K / ; G06F / ;
U.S. Cl.
CPC ...
382-8 ; 382 16 ; 382 42 ; 382 48 ; 382 56 ; 36441317 ; 3642219 ; 3642752 ; 3649754 ; 318596 ;
Abstract

In order to easily identify a pattern of time-series state changes based on measured information so as to facilitate representation of edge portions of an image, features extracted in a form of expansion coefficients of polynomials from the measured information are translated into abstract expressions so as to detect from the measured information significant control information which has not been used in the conventional technology, and features extracted in a form of expansion coefficients from brightness changes in the vicinity of each pixel constituting image data are translated into abstract expression.

Find Patent Forward Citations

Nishiya, Takushi. (1992). Processor for pattern data, measured process information, and image (U.S. Patent No. 5127063). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5127063

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