The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 1992

Filed:

Sep. 19, 1990
Applicant:
Inventors:

Toshihiko Oda, Sagamihara, JP;

Eiichi Katoh, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G01R / ;
U.S. Cl.
CPC ...
371 151 ; 3642763 ; 364D / ; 395575 ; 395916 ;
Abstract

A fault diagnosis expert system for locating and eliminating sources of a machine trouble. The system comprises a storage part for storing an expert knowledge constructed in a hierarchical search tree structure in which cause-to-effect links connecting high-level effect events to low-level cause events are pre-defined and all possible low-level cause events are pre-enumerated for each high-level effect event, a user interface part for providing a user with questions and responses regarding the state of the machine trouble, an inference part for inferring a cause of the machine trouble with the expert knowledge and the user information, and an outputting part for allowing inference results from the inference part to be displayed for the user. The expert knowledge includes a cause candidate criterion pre-defined as an event used for selection of searching paths when the inference part makes a decision as to which path of the search tree should be traced back. The cause-to-effect links include an identifier indicative of a difference between self-dependency causes and other-dependency causes.


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