The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 1992

Filed:

Aug. 25, 1989
Applicant:
Inventors:

Hiroaki Nishiguma, Kanagawa, JP;

Hidekazu Hoshino, Kanagawa, JP;

Assignee:

NHK Spring Co., Ltd., Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369 4441 ; 369 4442 ; 369 4423 ; 369 4424 ; 369 4414 ;
Abstract

An optical head structure, comprising: a light source; an optical system for projecting a first light beam from the light source upon an optical data recording medium and guiding a second light beam produced from the optical data recording medium as a result of projecting the first light beam, as a converging light beam; a light detecting element having at a photoelectric surface area divided into at least three surface parts, consisting of a central band part extending centrally and diametrally across the surface area and a pair of adjoining outer parts which are arranged on either side of the central band part, to receive the second light beam at a position in a path of the second light beam slightly displaced from a focal point of the second light beam; and a subtracter for producing a difference between an output from the central band part and a sum of outputs of the adjoining parts; the central band part being progressively narrower as it extends away from a central part of the photoelectric surface area. Thus, the sensitivity of focal error detection can be improved, and a desired linearity can be attained in the focal error detection property.


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