The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 1992
Filed:
Aug. 23, 1990
Francois Morin, Longueuil, CA;
Michael Parker, Ste-Julie, CA;
Hydro-Quebec, Montreal, CA;
Abstract
A probe for use in non-destructive measuring of electrical resistance of a high current electrical connection between two high current electrical conductors, each of the conductors having a longitudinal exterior surface, the probe comprising: an articulated body being articulated about a longitudinal axis; a plurality of electrodes provided on an interior portion of the articulated body for engaging about the longitudinal exterior surface; connecting means for releaseably connecting the articulating body around the longitudinal exterior surface, the connecting means including resilient means cooperating with the plurality of electrodes for causing the electrodes to resiliently engage the surface, the electrodes being located on the probe body to be arranged substantially evenly around and on the longitudinal exterior surface of the corresponding conductor in a plane substantially perpendicular to a current flow in the conductor; and resistors connected in series with each electrode, each of the resistors having substantially an equal resistance substantially greater than a contact resistance between the corresponding electrode and the corresponding conductor, the resistors being connected to at least one common terminal for connection to a high sensitivity low resistance ohm-meter. The probe makes the measuring easier and more accurate by assuring a good current distribution in the conductors.